检索条件: sponsored by Electronics Test, Circuits Manufacturing and EEOS/ESD Technology Magazines ( 著者 )
责任者 sponsored by Electronics Test, Circuits Manufacturing and EEOS/ESD Technology Magazines
出版信息 MG Expositions Group ,1988
ISBN
扫二维码,手机查看
在粘贴到您的文章之前,请再检查一遍引文格式的准确性。
ATE & Instrumentation Conference West (1989 : Anaheim, Calif.):Innovation in test
sponsored by Electronics Test, Circuits Manufacturing and EEOS/ESD Technology Magazines.MG Expositions Group,1988.
通借图书
加入成功
您可到个人图书馆查看或取消预约
预约图书
您可在“我的图书馆→我的预约”菜单里查看预约记录
没有可借图书,您可对该书进行预约,等书还回后会按照预约顺序分配给您