International machinery Monitoring and Diagnostics Conference and Exhibit.International Machinery Monitoring and Diagnostics Conference and Exhibit (2nd : 1990 : California):IMMDC.SEM,1990.
R. P. Bccker,O. Johari.Scanning electron microscopy.1978/V.2:An International review of advances in biological techniques and applications of the scanning electron microscope.SEM Inc.,1978.
Scanning electron microscopy.1978/V.2:An International review of advances in biological techniques and applications of the scanning electron microscope