检索条件： Ramesham, Rajeshuni. ( 著者 )

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1 图书 Reliability, packaging, testing, and characterization of MEMS/MOEMS V : 25-26 January, 2006, San Jose, California, USA /
责任者 Tanner, Danelle Mary,,Ramesham, Rajeshuni.

出版信息 SPIE, ,c2006.

ISBN 0-8194-6153-9

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Tanner, Danelle Mary,,Ramesham, Rajeshuni..Reliability, packaging, testing, and characterization of MEMS/MOEMS V : 25-26 January, 2006, San Jose, California, USA /.SPIE,,c2006..
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http://libopac.nudt.edu.cn:80/opac/book/245272
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Reliability, packaging, testing, and characterization of MEMS/MOEMS V : 25-26 January, 2006, San Jose, California, USA /

Tanner, Danelle Mary,,Ramesham, Rajeshuni..SPIE,,c2006..
2 图书 Reliability, packaging, testing, and characterization of MEMS/MOEMS IV : 24-25 January, 2005, San Jose, California, USA /
责任者 Tanner, Danelle Mary,,Ramesham, Rajeshuni.

出版信息 SPIE, ,c2005.

ISBN 0-8194-5690-X (pbk.)

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Tanner, Danelle Mary,,Ramesham, Rajeshuni..Reliability, packaging, testing, and characterization of MEMS/MOEMS IV : 24-25 January, 2005, San Jose, California, USA /.SPIE,,c2005..
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http://libopac.nudt.edu.cn:80/opac/book/245270
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Reliability, packaging, testing, and characterization of MEMS/MOEMS IV : 24-25 January, 2005, San Jose, California, USA /

Tanner, Danelle Mary,,Ramesham, Rajeshuni..SPIE,,c2005..

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