检索条件： International Automatic Testing Conference ( 著者 )

检索结果共有10条

匹配度排行

出版/发布时间

在馆记录

检索筛选

1 图书 IEEE International Automatic Testing Conference (1989 : Pennsylavania)：AUTOTESTCON `89 : automatic testing in the next-decada and the 21st century
责任者 IEEE International Automatic Testing Conference

出版信息 IEEE ,1989

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
IEEE International Automatic Testing Conference.IEEE International Automatic Testing Conference (1989 : Pennsylavania)：AUTOTESTCON `89 : automatic testing in the next-decada and the 21st century.IEEE,1989.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/34012
复制引文到剪贴板

IEEE International Automatic Testing Conference (1989 : Pennsylavania)：AUTOTESTCON `89 : automatic testing in the next-decada and the 21st century

IEEE International Automatic Testing Conference.IEEE,1989.
2 图书 International Automatic Testing Conference(1979 : Minnesot)：IEEE 1979 AUTOTESTCON
责任者 IEEE,International Automatic Testing Conference

出版信息 IEEE ,1979

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
IEEE,International Automatic Testing Conference.International Automatic Testing Conference(1979 : Minnesot)：IEEE 1979 AUTOTESTCON.IEEE,1979.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/37253
复制引文到剪贴板

International Automatic Testing Conference(1979 : Minnesot)：IEEE 1979 AUTOTESTCON

IEEE,International Automatic Testing Conference.IEEE,1979.
3 图书 International Automatic Testing Conference (1981 : Orlando, Florida)：Autotestcon, 81
责任者 Institute of Electrical and Electronic Engineers,International Automatic Testing Conference

出版信息 IEEE ,1981

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronic Engineers,International Automatic Testing Conference.International Automatic Testing Conference (1981 : Orlando, Florida)：Autotestcon, 81.IEEE,1981.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/33936
复制引文到剪贴板

International Automatic Testing Conference (1981 : Orlando, Florida)：Autotestcon, 81

Institute of Electrical and Electronic Engineers,International Automatic Testing Conference.IEEE,1981.
4 图书 International Automatic Testing Conference (1980 : Washington)：AUTOTESTCON `80
责任者 Institute of Electrical and Electronic Engineers,International Automatic Testing Conference

出版信息 IEEE ,1980

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronic Engineers,International Automatic Testing Conference.International Automatic Testing Conference (1980 : Washington)：AUTOTESTCON `80.IEEE,1980.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/33249
复制引文到剪贴板

International Automatic Testing Conference (1980 : Washington)：AUTOTESTCON `80

Institute of Electrical and Electronic Engineers,International Automatic Testing Conference.IEEE,1980.
5 图书 IEEE International Automatic Testing Conference (1988 : Minneapolis, Ma)：AUTOTESTCON `88
责任者 Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86

出版信息 IEEE ,1988

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86.IEEE International Automatic Testing Conference (1988 : Minneapolis, Ma)：AUTOTESTCON `88.IEEE,1988.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/34004
复制引文到剪贴板

IEEE International Automatic Testing Conference (1988 : Minneapolis, Ma)：AUTOTESTCON `88

Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86.IEEE,1988.
6 图书 IEEE International Automatic Testing Conference (1987 : San Francisco)：AUTOTESTCON `87 : bridging standards to advancing technology
责任者 Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86

出版信息 IEEE ,1987

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86.IEEE International Automatic Testing Conference (1987 : San Francisco)：AUTOTESTCON `87 : bridging standards to advancing technology.IEEE,1987.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/34130
复制引文到剪贴板

IEEE International Automatic Testing Conference (1987 : San Francisco)：AUTOTESTCON `87 : bridging standards to advancing technology

Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86.IEEE,1987.
7 图书 IEEE International Automatic Testing Conference (1986 : San Antonio)：AUTOTESTCON `86
责任者 Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86

出版信息 IEEE ,1986

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86.IEEE International Automatic Testing Conference (1986 : San Antonio)：AUTOTESTCON `86.IEEE,1986.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/34094
复制引文到剪贴板

IEEE International Automatic Testing Conference (1986 : San Antonio)：AUTOTESTCON `86

Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `86.IEEE,1986.
8 图书 IEEE International Automatic Testing Conference (1985 : New York)：AUTOTESTCON `85
责任者 Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `85

出版信息 IEEE ,1985

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `85.IEEE International Automatic Testing Conference (1985 : New York)：AUTOTESTCON `85.IEEE,1985.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/34085
复制引文到剪贴板

IEEE International Automatic Testing Conference (1985 : New York)：AUTOTESTCON `85

Institute of Electrical and Electronics Engineers,IEEE International Automatic Testing Conference,AUTOTESTCON `85.IEEE,1985.
9 图书 IEEE International Automatic Testing Conference (1982 : Dayton, Ohio)：Autotestcon `82
责任者 Institute of Electrical and Electronic Engineers,IEEE International Automatic Testing Conference

出版信息 IEEE ,1982

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronic Engineers,IEEE International Automatic Testing Conference.IEEE International Automatic Testing Conference (1982 : Dayton, Ohio)：Autotestcon `82.IEEE,1982.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/33851
复制引文到剪贴板

IEEE International Automatic Testing Conference (1982 : Dayton, Ohio)：Autotestcon `82

Institute of Electrical and Electronic Engineers,IEEE International Automatic Testing Conference.IEEE,1982.
10 图书 International Automatic Testing Conference (1978)：AUTOTESTCON`78
责任者 Institute of Electrical and Electronic Engineers,AUTOTESTCON `78,International Automatic Testing Conference

出版信息 s. n. ,1978

ISBN

馆藏信息

图书信息

随书附盘
扫二维码，手机查看
馆内电子资源：点击查看电子书
- 暂无电子资源
Institute of Electrical and Electronic Engineers,AUTOTESTCON `78,International Automatic Testing Conference.International Automatic Testing Conference (1978)：AUTOTESTCON`78.s. n.,1978.
复制引文到剪贴板
在粘贴到您的文章之前，请再检查一遍引文格式的准确性。

http://libopac.nudt.edu.cn:80/opac/book/33089
复制引文到剪贴板

International Automatic Testing Conference (1978)：AUTOTESTCON`78

Institute of Electrical and Electronic Engineers,AUTOTESTCON `78,International Automatic Testing Conference.s. n.,1978.

通借成功!

预约成功!