检索条件： Electron-beam technology in microelectronic fabrication ( 题名 )

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1 图书 Electron-beam technology in microelectronic fabrication
责任者 G. R. Brewer

出版信息 Academic Pr. ,1980

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G. R. Brewer.Electron-beam technology in microelectronic fabrication.Academic Pr.,1980.
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http://libopac.nudt.edu.cn:80/opac/book/21716
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Electron-beam technology in microelectronic fabrication

G. R. Brewer.Academic Pr.,1980.
2 图书 Future trends in microelectronics : from nanophotonics to sensors and energy /
责任者 Luryi, Serge.,Xu, Jimmy.,Zaslavsky, Alexander.

出版信息 WILEY-IEEE, ,c2010.

ISBN 9780470551370 (cloth) :

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Luryi, Serge.,Xu, Jimmy.,Zaslavsky, Alexander..Future trends in microelectronics : from nanophotonics to sensors and energy /.WILEY-IEEE,,c2010..
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http://libopac.nudt.edu.cn:80/opac/book/525327
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Future trends in microelectronics : from nanophotonics to sensors and energy /

Luryi, Serge.,Xu, Jimmy.,Zaslavsky, Alexander..WILEY-IEEE,,c2010..
3 图书 Materials issues in vacuum microelectronics: symposium held April 13-16, 1998, San Francisco, California, U.S.A.
责任者 Zhu, Wei,

出版信息 Materials Research Society ,2015.

ISBN 978-1-107-41362-7

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Zhu, Wei,.Materials issues in vacuum microelectronics: symposium held April 13-16, 1998, San Francisco, California, U.S.A..Materials Research Society,2015..
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http://libopac.nudt.edu.cn:80/opac/book/472860
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Materials issues in vacuum microelectronics: symposium held April 13-16, 1998, San Francisco, California, U.S.A.

Zhu, Wei,.Materials Research Society,2015..
4 图书现代微电子制造技术全科工程师指南：热点问题及其机理解析：hot issues and mechanism analysis
责任者樊融融

出版信息中国水利水电出版社 ,2023

ISBN 978-7-5226-1762-6

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樊融融.现代微电子制造技术全科工程师指南：热点问题及其机理解析：hot issues and mechanism analysis.中国水利水电出版社,2023.
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http://libopac.nudt.edu.cn:80/opac/book/876888
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现代微电子制造技术全科工程师指南：热点问题及其机理解析：hot issues and mechanism analysis

樊融融.中国水利水电出版社,2023.
5 图书 New approaches to image processing based failure analysis of nano-scale ULSI devices /
责任者 Livshits, Pavel.,Gur, Eran.

出版信息 Elsevier/William Andrew, ,[2014]

ISBN 9780323241434 :

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Livshits, Pavel.,Gur, Eran..New approaches to image processing based failure analysis of nano-scale ULSI devices /.Elsevier/William Andrew,,[2014].
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http://libopac.nudt.edu.cn:80/opac/book/525159
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New approaches to image processing based failure analysis of nano-scale ULSI devices /

Livshits, Pavel.,Gur, Eran..Elsevier/William Andrew,,[2014].
6 图书 Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A. /
责任者 , Qinghuang Lin

出版信息 Cambridge University Press, ,2014.

ISBN 978-1-107-40871-5

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, Qinghuang Lin.Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A. /.Cambridge University Press,,2014..
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http://libopac.nudt.edu.cn:80/opac/book/472620
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Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A. /

, Qinghuang Lin.Cambridge University Press,,2014..
7 图书 Electronic thin film reliability /
责任者 King-Ning Tu.

出版信息 Cambridge University Press, ,2010.

ISBN 9780521516136

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King-Ning Tu..Electronic thin film reliability /.Cambridge University Press,,2010..
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http://libopac.nudt.edu.cn:80/opac/book/325120
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Electronic thin film reliability /

King-Ning Tu..Cambridge University Press,,2010..
8 图书 Radio frequency propagation made easy /
责任者 by Saleh Faruque.

出版信息

ISBN 9783319113937 (paper) :

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by Saleh Faruque..Radio frequency propagation made easy /.,.
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http://libopac.nudt.edu.cn:80/opac/book/527925
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Radio frequency propagation made easy /

by Saleh Faruque..,.
9 图书 Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A. /
责任者 Baklanov, Mikhail R.

出版信息 Materials Research Society ; ,2012.

ISBN 9781605113128 (hbk.)

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Baklanov, Mikhail R..Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A. /.Materials Research Society ;,2012..
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http://libopac.nudt.edu.cn:80/opac/book/411315
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Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A. /

Baklanov, Mikhail R..Materials Research Society ;,2012..
10 图书 Guide to state-of-the-art electron devices /
责任者 edited by Joachim N. Burghartz, Institute for microelectronics Stuttgart (IMS CHIPS), Germany.

出版信息 John Wiley & Sons Inc., ,2013.

ISBN 9781118347263 (hardback) :

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edited by Joachim N. Burghartz, Institute for microelectronics Stuttgart (IMS CHIPS), Germany..Guide to state-of-the-art electron devices /.John Wiley & Sons Inc.,,2013..
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http://libopac.nudt.edu.cn:80/opac/book/526587
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Guide to state-of-the-art electron devices /

edited by Joachim N. Burghartz, Institute for microelectronics Stuttgart (IMS CHIPS), Germany..John Wiley & Sons Inc.,,2013..

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