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中图分类法:
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TN7 版次： |
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著者:
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Ibe, Eishi H. |
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题名:
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Terrestrial radiation effects in ULSI devices and electronic systems / / , |
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出版发行:
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出版地： Singapore : 出版社： John Wiley & Sons Inc., 出版日期： 2015. |
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载体形态:
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xxiv, 268 p. : ill. ; 25 cm. |
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主题词:
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Electronic circuits Effect of radiation on. |
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主题词:
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Integrated circuits Ultra large scale integration |
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主题词:
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Integrated circuits Effect of radiation on. |
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索书号:
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1 |