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中图分类法:
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TN402-532 版次： |
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题名:
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Semiconductor process and device performance modelling [ symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A. ] / , |
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出版发行:
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出版地： Warrendale, Pa. 出版社： Materials Research Society, 出版日期： 2014. |
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载体形态:
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ix, 273 p. ill. 24 cm. |
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附注:
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Originally published: 1998. |
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主题词:
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Semiconductors Mathematical models |
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主题词:
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Semiconductors Defects |
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主题词:
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Solid state physics |
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主要责任者:
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Dunham, S. T. |
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主要责任者:
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Nelson, Jeffrey S. |
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索书号:
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1 |