科图分类法:	QD906.7.E37 版次：
中图分类法:	O7-532 版次：
题名:	Electron crystallography for materials research and quantitative characterization of nanostructured materials [ symposia held April 14-16, 2009, San Francisco, California, USA] / ,
版次:	First paperback edition.
载体形态:	viii, 211 pages illustrations 23 cm
附注:	"Symposium GG, 'Electron Crystallography for Materials Research,' held April 13-14 at the 2009 MRS Spring Meeting in San Francisco, California"--Page [ix]
附注:	"Symposium HH, 'Quantitative Characterization of Nanostructured Materials,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California"-- Page [xi]
主题词:	Crystallography
主题词:	Electron microscopy
主题词:	Nanocrystals
主要责任者:	Moeck, Peter,
主要责任者:	Bridges, Frank George Baskerville,
次要责任者:	Symposium HH, "Quantitative Characterization of.
索书号:	1