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科图分类法:
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TN16 版次： |
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中图分类法:
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TN16 版次： |
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题名:
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Aberration-corrected analytical transmission electron microscopy / / , |
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出版发行:
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出版地： Chichester, West Sussex, U.K. : 出版社： RMS-Wiley, 出版日期： 2011. |
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载体形态:
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xv, 280 p. : ill. ; 24 cm. |
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内容提要:
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"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- |
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内容提要:
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"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- |
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主题词:
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Transmission electron microscopy. |
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主题词:
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Aberration. |
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主题词:
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Achromatism. |
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主要责任者:
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Brydson, Rik |
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索书号:
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1 |