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题名:
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NATO Advanced Study Institute on Characterization of Crystals Growth Defects by X-Ray Methods ( 1979 : Durtham ,Eng. ) / , |
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ISBN:
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价格： ￥6.10 |
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语种:
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eng |
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载体形态:
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589 p. |
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出版发行:
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出版地： N. Y. 出版社： Plenum 出版日期： 1980 |
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其它题名:
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Characterization of Crystals Growth Defects by X-Ray Methods |
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主要团体责任者:
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NATO Advanced Study Institute on Characterization of Crystals Growth Defects by X-Ray Methods |
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索书号:
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2 |