题名:
Semiconductor test conference (1979 : Cherry Hill, Newe Jersey)   / , Sponsored by IEEE Computer Society, Test Technology Committee and the Phila. Section of the IEEE
ISBN:
价格: ¥5.90
语种:
eng
载体形态:
382 p.
出版发行:
出版地: Long Beach 出版社: IEEE 出版日期: 1979
主要团体责任者:
Institute of Electrical and Electronics Engineers
主要团体责任者:
Semiconductor test conference
索书号:
2