题名:
|
World Conference on Non-Destructive Testing (12th : 1989 : Amsterdam) / Ed. by J. Boogaard and G. M. van Dijk , |
ISBN:
|
价格: ¥51.40 |
语种:
|
eng |
载体形态:
|
871-1900 p. |
出版发行:
|
出版地: Amsterdam 出版社: Elsevier 出版日期: 1989 |
其它题名:
|
Non-destructive testing |
主要责任者:
|
Boogaard |
主要团体责任者:
|
World Conference on Non-Destructive Testing |
索书号:
|
1 |