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题名:
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International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama) / , |
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ISBN:
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价格： ￥65.40,52.90 |
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语种:
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eng |
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载体形态:
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1746 p.(2V) |
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出版发行:
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出版地： Amsterdam 出版社： NH 出版日期： 1990 |
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主要团体责任者:
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International Conference on the Science and Technology of Defect Control in Semiconductors |
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索书号:
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2 |