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题名:
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IEEE International Automatic Testing Conference (1987 : San Francisco) / Institute of Electrical and Electronics Engineers , |
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ISBN:
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价格： ￥33.70 |
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语种:
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eng |
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载体形态:
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494 p. |
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出版发行:
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出版地： N. Y. 出版社： IEEE 出版日期： 1987 |
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其它题名:
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AUTOTESTCON `87 : bridging standards to advancing technology |
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主要团体责任者:
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Institute of Electrical and Electronics Engineers |
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主要团体责任者:
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IEEE International Automatic Testing Conference |
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主要团体责任者:
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AUTOTESTCON `86 |
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索书号:
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1 |