题名:
|
ATE & Instrumentation Conference West (1989 : Anaheim, Calif.) / sponsored by Electronics Test, Circuits Manufacturing and EEOS/ESD Technology Magazines , |
ISBN:
|
价格: ¥36.90 |
语种:
|
eng |
载体形态:
|
550 p |
出版发行:
|
出版地: Boston 出版社: MG Expositions Group 出版日期: 1988 |
其它题名:
|
Innovation in test |
主要团体责任者:
|
Electronics Test, Circuits Manufacturing and EEOS/ESD Technology Magazines |
主要团体责任者:
|
ATE & Instrumentation Conference West |
索书号:
|
1 |